Modeling of Structural Defects in Silicon Carbide


Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

This paper reports DFT calculations of the electron density in pure and imperfect silicon carbide clusters. The local levels produced in the band gap by doping are shown to be determined predominantly by intrinsic states of the silicon and carbon.

About the authors

E. V. Sokolenko

North-Caucasus Federal University

Author for correspondence.
Email: sokolenko-ev-svis@rambler.ru
Russian Federation, ul. Pushkina 1, Stavropol, 355009

G. V. Slyusarev

North-Caucasus Federal University

Email: sokolenko-ev-svis@rambler.ru
Russian Federation, ul. Pushkina 1, Stavropol, 355009

Supplementary files

Supplementary Files
Action
1. JATS XML

Copyright (c) 2019 Pleiades Publishing, Inc.