Modeling of Structural Defects in Silicon Carbide


如何引用文章

全文:

开放存取 开放存取
受限制的访问 ##reader.subscriptionAccessGranted##
受限制的访问 订阅存取

详细

This paper reports DFT calculations of the electron density in pure and imperfect silicon carbide clusters. The local levels produced in the band gap by doping are shown to be determined predominantly by intrinsic states of the silicon and carbon.

作者简介

E. Sokolenko

North-Caucasus Federal University

编辑信件的主要联系方式.
Email: sokolenko-ev-svis@rambler.ru
俄罗斯联邦, ul. Pushkina 1, Stavropol, 355009

G. Slyusarev

North-Caucasus Federal University

Email: sokolenko-ev-svis@rambler.ru
俄罗斯联邦, ul. Pushkina 1, Stavropol, 355009

补充文件

附件文件
动作
1. JATS XML

版权所有 © Pleiades Publishing, Inc., 2019