Cell of the silicon integrated reading circuit with built-it analog-digital converter


Citar

Texto integral

Acesso aberto Acesso aberto
Acesso é fechado Acesso está concedido
Acesso é fechado Somente assinantes

Resumo

This paper describes the project of an accumulative cell of a silicon integrated signal reading circuit with a built-in analog-digital converter for matrix IR photodetectors based on the Hg1-xCdxTe solid solutions with the sensitivity in the spectral range from 8 to 10 µm. The cell is designed according to the silicon technology HCMOS8D of JSC “NIIME i Mikron” (Moscow) with a project norm of 0.18 µm. The presented project of the cell has the size of 20×2020 µm, and the number of bits in the built-in analog-digital converter is 15. When the average photocurrent is 7 nA and the integration time is 7.5 ms, the estimated value of the noise equivalent delta temperature is 4.6 mK.

Sobre autores

A. Zverev

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: makarov@isp.nsc.ru
Rússia, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090

Yu. Makarov

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Autor responsável pela correspondência
Email: makarov@isp.nsc.ru
Rússia, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090

E. Mikhant’ev

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: makarov@isp.nsc.ru
Rússia, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090

S. Dvoretskii

Rzhanov Institute of Semiconductor Physics, Siberian Branch

Email: makarov@isp.nsc.ru
Rússia, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090

Arquivos suplementares

Arquivos suplementares
Ação
1. JATS XML

Declaração de direitos autorais © Allerton Press, Inc., 2016