Analytical Review of Two-Signal Methods for Measuring the S-Parameters of Two-Port Networks


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In this paper, we consider two-signal and modified two-signal methods for measuring the S-parameters of passive two-ports and a method for adequately measuring the S-parameters of two-ports, such as transistors, developed on their basis. The methods are implemented using a coaxial simulator-analyzer of microwave amplifiers and oscillators in its measuring channels matched or mismatched with loads. The field of application and the interrelation between these methods are investigated, and their advantages and disadvantages are discussed. Data on the maximum measurement error of the methods are presented.

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S. Savel’kaev

Siberian State University of Geosystems and Technologies

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Email: sergei.savelkaev@yandex.ru
俄罗斯联邦, ul. Plakhotnogo 10, Novosibirsk, 630108

V. Litovchenko

Novosibirsk Higher Military Command School

Email: sergei.savelkaev@yandex.ru
俄罗斯联邦, ul. Ivanova 49, Novosibirsk, 630117

N. Zarzhetskaya

Siberian State University of Geosystems and Technologies

Email: sergei.savelkaev@yandex.ru
俄罗斯联邦, ul. Plakhotnogo 10, Novosibirsk, 630108

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