Germanium-based metal-insulator-semiconductor transistors as a direction for the further development of CMOS technology
- 作者: Neizvestny I.G.1
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隶属关系:
- Rzhanov Institute of Semiconductor Physics, Siberian Branch
- 期: 卷 52, 编号 5 (2016)
- 页面: 421-427
- 栏目: Physical and Engineering Fundamentals of Microelectronics and Optoelectronics
- URL: https://journals.rcsi.science/8756-6990/article/view/211994
- DOI: https://doi.org/10.3103/S8756699016050010
- ID: 211994
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详细
The possibility of improving the performance of semiconductor integrated circuits by replacing the silicon layer in metal–insulator–semiconductor (MIS) transistors by a material with higher charge-carrier mobility. It is shown that germanium is best suited for this purpose based on its properties. Developments made in this area in different laboratories both in Russia and abroad are discussed.
作者简介
I. Neizvestny
Rzhanov Institute of Semiconductor Physics, Siberian Branch
编辑信件的主要联系方式.
Email: neizv@isp.nsc.ru
俄罗斯联邦, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090
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