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Optoelectronics, Instrumentation and Data Processing
ISSN 8756-6990 (Print) ISSN 1934-7944 (Online)
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Keywords Fourier optics Raman scattering computer simulation diffraction efficiency diffractive optical element diffusion digital holography dimensional inspection hyperspectral images image processing image reconstruction laser writing light diffraction mathematical model maximum likelihood method nanomaterials perturbation functions remote sensing scanning speed silicon terahertz radiation
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Keywords Fourier optics Raman scattering computer simulation diffraction efficiency diffractive optical element diffusion digital holography dimensional inspection hyperspectral images image processing image reconstruction laser writing light diffraction mathematical model maximum likelihood method nanomaterials perturbation functions remote sensing scanning speed silicon terahertz radiation
Home > Search > Browse Section Index > Interference Systems and Devices

Interference Systems and Devices

Issue Title File
Vol 53, No 5 (2017) Manufacturing and certification of a diffraction corrector for controlling the surface shape of the six-meter main mirror of the Big Azimuthal Telescope of the Russian Academy of Sciences PDF
(Eng)
Nasyrov R.K., Poleshchuk A.G.
Vol 53, No 5 (2017) Interferometric method for controlling the assembly quality of an optical system with an eccentrically arranged aspheric lense PDF
(Eng)
Nasyrov R.K., Poleshchuk A.G., Sokol’skii M.N., Tregub V.P.
Vol 53, No 5 (2017) Automated interference tools of the All-Russian Research Institute for Optical and Physical Measurements PDF
(Eng)
Vishnyakov G.N., Levin G.G., Minaev V.L.
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