A device for measuring the scattering indicatrix of the nanomaterial synthesis process
- Авторы: Matyushkin L.B.1, Aleksandrova O.A.1, Moshnikov V.A.1
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Учреждения:
- St. Petersburg State Electrotechnical University LETI
- Выпуск: Том 43, № 3 (2017)
- Страницы: 263-266
- Раздел: Article
- URL: https://journals.rcsi.science/1087-6596/article/view/216002
- DOI: https://doi.org/10.1134/S1087659617030063
- ID: 216002
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Аннотация
An installation diagram for the study of nanomaterials using scattering indicatrices has been presented. It has been shown that the suggested procedure allows the online investigation and control of the synthesis of nanomaterials, as exemplified by the preparation of SiO2 by the Stöber method and chemical bath deposition of the lead sulfide PbS layer.
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Об авторах
L. Matyushkin
St. Petersburg State Electrotechnical University LETI
Автор, ответственный за переписку.
Email: leva.matyushkin@gmail.com
Россия, St. Petersburg, 197022
O. Aleksandrova
St. Petersburg State Electrotechnical University LETI
Email: leva.matyushkin@gmail.com
Россия, St. Petersburg, 197022
V. Moshnikov
St. Petersburg State Electrotechnical University LETI
Email: leva.matyushkin@gmail.com
Россия, St. Petersburg, 197022
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