Email this article A device for measuring the scattering indicatrix of the nanomaterial synthesis process
- Authors: Matyushkin L.B.1, Aleksandrova O.A.1, Moshnikov V.A.1
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Affiliations:
- St. Petersburg State Electrotechnical University LETI
- Issue: Vol 43, No 3 (2017)
- Pages: 263-266
- Section: Article
- URL: https://journals.rcsi.science/1087-6596/article/view/216002
- DOI: https://doi.org/10.1134/S1087659617030063
- ID: 216002
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Abstract
An installation diagram for the study of nanomaterials using scattering indicatrices has been presented. It has been shown that the suggested procedure allows the online investigation and control of the synthesis of nanomaterials, as exemplified by the preparation of SiO2 by the Stöber method and chemical bath deposition of the lead sulfide PbS layer.
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About the authors
L. B. Matyushkin
St. Petersburg State Electrotechnical University LETI
Author for correspondence.
Email: leva.matyushkin@gmail.com
Russian Federation, St. Petersburg, 197022
O. A. Aleksandrova
St. Petersburg State Electrotechnical University LETI
Email: leva.matyushkin@gmail.com
Russian Federation, St. Petersburg, 197022
V. A. Moshnikov
St. Petersburg State Electrotechnical University LETI
Email: leva.matyushkin@gmail.com
Russian Federation, St. Petersburg, 197022
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