An X-ray spectral and theoretical study of the electronic structure and features of interatomic interactions in phenoxysilanes

Аннотация

The electronic structure and features of interatomic interactions providing the Si–O–C₆H₅ bonds in H_4-nSi(OC₆H₅)_n (n = 1–4) were studied by a combined analysis of the X-ray emission and photoelectron spectroscopic data and the results of quantum-chemical calculations. Theoretical calculations were carried out using the density functional theory. The distributions of the density of states were constructed, the correlation energy diagrams were presented, and the main types of interatomic interactions in phenoxysilanes were revealed.