Мақаланы E-mail арқылы жіберу Studying Nanotribological Properties of Functional Materials via Atomic Force Microscopy
- Авторлар: Zubar T.I.1,2, Chizhik S.A.1
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Мекемелер:
- Scientific and Practical Center of Materials Science, National Academy of Sciences
- Lykov Institute of Heat and Mass Exchange, National Academy of Sciences
- Шығарылым: Том 40, № 3 (2019)
- Беттер: 201-206
- Бөлім: Article
- URL: https://journals.rcsi.science/1068-3666/article/view/229287
- DOI: https://doi.org/10.3103/S1068366619030140
- ID: 229287
Дәйексөз келтіру
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Рұқсат берілді
Тек жазылушылар үшін
Аннотация
Abstract—Nanotribological tests via atomic force microscopy were optimized by recording the lateral interaction forces between the probe tip and the sample surface in the contact mode. In the case of thin film metal materials, the technique enabled us to determine independently the sliding force and the static friction force, which reduced the measurement error of tribological characteristics at the nanoscale by 3—5 times.
Негізгі сөздер
Авторлар туралы
T. Zubar
Scientific and Practical Center of Materials Science, National Academy of Sciences; Lykov Institute of Heat and Mass Exchange, National Academy of Sciences
Хат алмасуға жауапты Автор.
Email: fix.tatyana@gmail.com
Белоруссия, Minsk, 220072; Minsk, 220072
S. Chizhik
Scientific and Practical Center of Materials Science, National Academy of Sciences
Email: fix.tatyana@gmail.com
Белоруссия, Minsk, 220072
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