Distribution of Deformations in the Oscillating X-Ray Acoustic Element Based on the X-Cut Quartz Crystal
- Autores: Mkrtchyan A.R.1,2, Blagov A.E.3,4, Kocharyan V.R.1,2, Kulikov A.G.3,4, Movsisyan A.E.1, Muradyan T.R.1, Targonsky A.V.3,4, Eliovich Y.A.3,4, Darinski A.N.3, Pisarevski Y.V.3,4, Kovalchuk M.V.3,4
-
Afiliações:
- Institute of Applied Problems of Physics
- National Research Tomsk Polytechnical University
- Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS
- National Research Center “Kurchatov Institute”
- Edição: Volume 54, Nº 2 (2019)
- Páginas: 210-218
- Seção: Article
- URL: https://journals.rcsi.science/1068-3372/article/view/228890
- DOI: https://doi.org/10.3103/S1068337219020142
- ID: 228890
Citar
Resumo
The mechanical deformations in the quartz X-ray acoustic element arising by the excitation of resonant thickness ultrasound oscillations are investigated experimentally and theoretically. Experiments were carried out using the X-ray topography and double-crystal diffractometry, and theoretical computations were performed using the mathematical modeling by the finite element method. It follows from the computations that the mechanical deformation arising in the resonator as a result of the excitation of thickness variations, is strongly stratified and represents a series of maxima, the distance between which depends on the crystallographic direction. The large number of nodes and antinodes of the oscillations directly depends on the resonant frequency of the X-ray acoustic element. The obtained experimental results are in good agreement with theoretical computations.
Palavras-chave
Sobre autores
A. Mkrtchyan
Institute of Applied Problems of Physics; National Research Tomsk Polytechnical University
Email: vahan2@yandex.ru
Armênia, Yerevan; Tomsk
A. Blagov
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Rússia, Moscow; Moscow
V. Kocharyan
Institute of Applied Problems of Physics; National Research Tomsk Polytechnical University
Autor responsável pela correspondência
Email: vahan2@yandex.ru
Armênia, Yerevan; Tomsk
A. Kulikov
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Rússia, Moscow; Moscow
A. Movsisyan
Institute of Applied Problems of Physics
Email: vahan2@yandex.ru
Armênia, Yerevan
T. Muradyan
Institute of Applied Problems of Physics
Email: vahan2@yandex.ru
Armênia, Yerevan
A. Targonsky
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Rússia, Moscow; Moscow
Ya. Eliovich
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Rússia, Moscow; Moscow
A. Darinski
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS
Email: vahan2@yandex.ru
Rússia, Moscow
Yu. Pisarevski
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Rússia, Moscow; Moscow
M. Kovalchuk
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Rússia, Moscow; Moscow
Arquivos suplementares
