Distribution of Deformations in the Oscillating X-Ray Acoustic Element Based on the X-Cut Quartz Crystal
- Authors: Mkrtchyan A.R.1,2, Blagov A.E.3,4, Kocharyan V.R.1,2, Kulikov A.G.3,4, Movsisyan A.E.1, Muradyan T.R.1, Targonsky A.V.3,4, Eliovich Y.A.3,4, Darinski A.N.3, Pisarevski Y.V.3,4, Kovalchuk M.V.3,4
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Affiliations:
- Institute of Applied Problems of Physics
- National Research Tomsk Polytechnical University
- Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS
- National Research Center “Kurchatov Institute”
- Issue: Vol 54, No 2 (2019)
- Pages: 210-218
- Section: Article
- URL: https://journals.rcsi.science/1068-3372/article/view/228890
- DOI: https://doi.org/10.3103/S1068337219020142
- ID: 228890
Cite item
Abstract
The mechanical deformations in the quartz X-ray acoustic element arising by the excitation of resonant thickness ultrasound oscillations are investigated experimentally and theoretically. Experiments were carried out using the X-ray topography and double-crystal diffractometry, and theoretical computations were performed using the mathematical modeling by the finite element method. It follows from the computations that the mechanical deformation arising in the resonator as a result of the excitation of thickness variations, is strongly stratified and represents a series of maxima, the distance between which depends on the crystallographic direction. The large number of nodes and antinodes of the oscillations directly depends on the resonant frequency of the X-ray acoustic element. The obtained experimental results are in good agreement with theoretical computations.
About the authors
A. R. Mkrtchyan
Institute of Applied Problems of Physics; National Research Tomsk Polytechnical University
Email: vahan2@yandex.ru
Armenia, Yerevan; Tomsk
A. E. Blagov
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Russian Federation, Moscow; Moscow
V. R. Kocharyan
Institute of Applied Problems of Physics; National Research Tomsk Polytechnical University
Author for correspondence.
Email: vahan2@yandex.ru
Armenia, Yerevan; Tomsk
A. G. Kulikov
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Russian Federation, Moscow; Moscow
A. E. Movsisyan
Institute of Applied Problems of Physics
Email: vahan2@yandex.ru
Armenia, Yerevan
T. R. Muradyan
Institute of Applied Problems of Physics
Email: vahan2@yandex.ru
Armenia, Yerevan
A. V. Targonsky
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Russian Federation, Moscow; Moscow
Ya. A. Eliovich
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Russian Federation, Moscow; Moscow
A. N. Darinski
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS
Email: vahan2@yandex.ru
Russian Federation, Moscow
Yu. V. Pisarevski
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Russian Federation, Moscow; Moscow
M. V. Kovalchuk
Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”
Email: vahan2@yandex.ru
Russian Federation, Moscow; Moscow
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