Distribution of Deformations in the Oscillating X-Ray Acoustic Element Based on the X-Cut Quartz Crystal


Дәйексөз келтіру

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Аннотация

The mechanical deformations in the quartz X-ray acoustic element arising by the excitation of resonant thickness ultrasound oscillations are investigated experimentally and theoretically. Experiments were carried out using the X-ray topography and double-crystal diffractometry, and theoretical computations were performed using the mathematical modeling by the finite element method. It follows from the computations that the mechanical deformation arising in the resonator as a result of the excitation of thickness variations, is strongly stratified and represents a series of maxima, the distance between which depends on the crystallographic direction. The large number of nodes and antinodes of the oscillations directly depends on the resonant frequency of the X-ray acoustic element. The obtained experimental results are in good agreement with theoretical computations.

Авторлар туралы

A. Mkrtchyan

Institute of Applied Problems of Physics; National Research Tomsk Polytechnical University

Email: vahan2@yandex.ru
Армения, Yerevan; Tomsk

A. Blagov

Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”

Email: vahan2@yandex.ru
Ресей, Moscow; Moscow

V. Kocharyan

Institute of Applied Problems of Physics; National Research Tomsk Polytechnical University

Хат алмасуға жауапты Автор.
Email: vahan2@yandex.ru
Армения, Yerevan; Tomsk

A. Kulikov

Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”

Email: vahan2@yandex.ru
Ресей, Moscow; Moscow

A. Movsisyan

Institute of Applied Problems of Physics

Email: vahan2@yandex.ru
Армения, Yerevan

T. Muradyan

Institute of Applied Problems of Physics

Email: vahan2@yandex.ru
Армения, Yerevan

A. Targonsky

Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”

Email: vahan2@yandex.ru
Ресей, Moscow; Moscow

Ya. Eliovich

Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”

Email: vahan2@yandex.ru
Ресей, Moscow; Moscow

A. Darinski

Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS

Email: vahan2@yandex.ru
Ресей, Moscow

Yu. Pisarevski

Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”

Email: vahan2@yandex.ru
Ресей, Moscow; Moscow

M. Kovalchuk

Federal Scientific Research Centre Crystallography and Photonics (KIF), RAS; National Research Center “Kurchatov Institute”

Email: vahan2@yandex.ru
Ресей, Moscow; Moscow

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