Taking into Account the Features of a Tunneling Microscope Control for Interpreting Measurements


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详细

An algorithm for interpreting the results of measurements made by a tunneling microscope that takes into account the specific features of the microscope control is studied. Conditions under which the model of the nanotopography constructed based on the measurements exactly reproduces the original surface are derived. The features of nanotopography that cannot be reproduced using the proposed interpretation techniques are described.

作者简介

V. Kartashev

Keldysh Institute of Applied Mathematics

Email: kart@list.ru
俄罗斯联邦, Moscow, 125047

V. Kartashev

Keldysh Institute of Applied Mathematics

编辑信件的主要联系方式.
Email: kart@list.ru
俄罗斯联邦, Moscow, 125047


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