Taking into Account the Features of a Tunneling Microscope Control for Interpreting Measurements
- 作者: Kartashev V.1, Kartashev V.1
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隶属关系:
- Keldysh Institute of Applied Mathematics
- 期: 卷 57, 编号 5 (2018)
- 页面: 784-788
- 栏目: Image Processing
- URL: https://journals.rcsi.science/1064-2307/article/view/220217
- DOI: https://doi.org/10.1134/S1064230718050064
- ID: 220217
如何引用文章
详细
An algorithm for interpreting the results of measurements made by a tunneling microscope that takes into account the specific features of the microscope control is studied. Conditions under which the model of the nanotopography constructed based on the measurements exactly reproduces the original surface are derived. The features of nanotopography that cannot be reproduced using the proposed interpretation techniques are described.
作者简介
V. Kartashev
Keldysh Institute of Applied Mathematics
Email: kart@list.ru
俄罗斯联邦, Moscow, 125047
V. Kartashev
Keldysh Institute of Applied Mathematics
编辑信件的主要联系方式.
Email: kart@list.ru
俄罗斯联邦, Moscow, 125047
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