Taking into Account the Features of a Tunneling Microscope Control for Interpreting Measurements
- Авторлар: Kartashev V.1, Kartashev V.1
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Мекемелер:
- Keldysh Institute of Applied Mathematics
- Шығарылым: Том 57, № 5 (2018)
- Беттер: 784-788
- Бөлім: Image Processing
- URL: https://journals.rcsi.science/1064-2307/article/view/220217
- DOI: https://doi.org/10.1134/S1064230718050064
- ID: 220217
Дәйексөз келтіру
Аннотация
An algorithm for interpreting the results of measurements made by a tunneling microscope that takes into account the specific features of the microscope control is studied. Conditions under which the model of the nanotopography constructed based on the measurements exactly reproduces the original surface are derived. The features of nanotopography that cannot be reproduced using the proposed interpretation techniques are described.
Авторлар туралы
V. Kartashev
Keldysh Institute of Applied Mathematics
Email: kart@list.ru
Ресей, Moscow, 125047
V. Kartashev
Keldysh Institute of Applied Mathematics
Хат алмасуға жауапты Автор.
Email: kart@list.ru
Ресей, Moscow, 125047
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