Taking into Account the Features of a Tunneling Microscope Control for Interpreting Measurements
- Autores: Kartashev V.1, Kartashev V.1
-
Afiliações:
- Keldysh Institute of Applied Mathematics
- Edição: Volume 57, Nº 5 (2018)
- Páginas: 784-788
- Seção: Image Processing
- URL: https://journals.rcsi.science/1064-2307/article/view/220217
- DOI: https://doi.org/10.1134/S1064230718050064
- ID: 220217
Citar
Resumo
An algorithm for interpreting the results of measurements made by a tunneling microscope that takes into account the specific features of the microscope control is studied. Conditions under which the model of the nanotopography constructed based on the measurements exactly reproduces the original surface are derived. The features of nanotopography that cannot be reproduced using the proposed interpretation techniques are described.
Sobre autores
V. Kartashev
Keldysh Institute of Applied Mathematics
Email: kart@list.ru
Rússia, Moscow, 125047
V. Kartashev
Keldysh Institute of Applied Mathematics
Autor responsável pela correspondência
Email: kart@list.ru
Rússia, Moscow, 125047
![](/img/style/loading.gif)