Malfunctioning of Microcontroller Irradiated with Ultrashort Ultrabroadband Pulse Trains

Abstract

Effect of the number of ultrashort ultrabroadband pulses with a repetition rate of 1 kHz on malfunctioning of microcontroller in radio transparent housing is studied when the device is irradiated using pulse trains at a pulse duration of about 10^–10 s and radiation frequencies ranging from 1 to 30 GHz. The radiation is received by internal conducting stripes that connect the electronic circuit and external outputs. The malfunction probability is determined by the number of pulses in the pulse train, pulse number, and electric field strength. It is shown that malfunctioning is predominantly caused by the leading pulses in the pulse train.