Electrical and Magnetic Properties of Ultrathin Polycrystalline Fe Films Grown on SiO 2 /Si(001)

V. V. Balashev; K. S. Ermakov; L. A. Chebotkevich; V. V. Korobtsov

doi:10.1134/S1063785018070040

Electrical and Magnetic Properties of Ultrathin Polycrystalline Fe Films Grown on SiO₂/Si(001)

Autores: Balashev V.¹^,2, Ermakov K.², Chebotkevich L.², Korobtsov V.¹^,2
Afiliações:
1. Institute of Automation and Control Processes, Far Eastern Branch
2. School of Natural Sciences
Edição: Volume 44, Nº 7 (2018)
Páginas: 595-598
Seção: Article
URL: https://journals.rcsi.science/1063-7850/article/view/207783
DOI: https://doi.org/10.1134/S1063785018070040
ID: 207783

Citar

Texto integral

Acesso aberto
Acesso é fechado

Acesso está concedido
Acesso é fechado

Somente assinantes

Resumo
Sobre autores
Bibliografia
Estatísticas

Resumo

Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transition to the structurally continuous film at a thickness of ~6 nm. It is found that Fe grains in this film acquire the preferred (111) orientation during this transition.

Sobre autores

V. Balashev

Institute of Automation and Control Processes, Far Eastern Branch; School of Natural Sciences

Autor responsável pela correspondência
Email: balashev@mail.dvo.ru
Rússia, Vladivostok, 690041; Vladivostok, 690090

K. Ermakov

School of Natural Sciences

Email: balashev@mail.dvo.ru
Rússia, Vladivostok, 690090

L. Chebotkevich