Electrical and Magnetic Properties of Ultrathin Polycrystalline Fe Films Grown on SiO 2 /Si(001)

V. V. Balashev; K. S. Ermakov; L. A. Chebotkevich; V. V. Korobtsov

doi:10.1134/S1063785018070040

Electrical and Magnetic Properties of Ultrathin Polycrystalline Fe Films Grown on SiO₂/Si(001)

Authors: Balashev V.V.¹^,2, Ermakov K.S.², Chebotkevich L.A.², Korobtsov V.V.¹^,2
Affiliations:
1. Institute of Automation and Control Processes, Far Eastern Branch
2. School of Natural Sciences
Issue: Vol 44, No 7 (2018)
Pages: 595-598
Section: Article
URL: https://journals.rcsi.science/1063-7850/article/view/207783
DOI: https://doi.org/10.1134/S1063785018070040
ID: 207783

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Abstract
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Abstract

Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transition to the structurally continuous film at a thickness of ~6 nm. It is found that Fe grains in this film acquire the preferred (111) orientation during this transition.

About the authors

V. V. Balashev

Institute of Automation and Control Processes, Far Eastern Branch; School of Natural Sciences

Author for correspondence.
Email: balashev@mail.dvo.ru
Russian Federation, Vladivostok, 690041; Vladivostok, 690090

K. S. Ermakov

School of Natural Sciences

Email: balashev@mail.dvo.ru
Russian Federation, Vladivostok, 690090

L. A. Chebotkevich