Email this article Measuring the Extinction Index of Dielectric Films Using Frustrated Total Internal Reflectance Spectroscopy
- Authors: Nguyen V.B.1, Gubanova L.A.1
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Affiliations:
- St. Petersburg State University of Information Technologies, Mechanics and Optics (ITMO University)
- Issue: Vol 44, No 8 (2018)
- Pages: 746-748
- Section: Article
- URL: https://journals.rcsi.science/1063-7850/article/view/207854
- DOI: https://doi.org/10.1134/S1063785018080278
- ID: 207854
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Abstract
Various methods of measuring the coefficient of light attenuation in optical coatings are considered. It is shown that the dimensionless extinction index of a coating made of a weakly absorbing film-forming material can be measured using a special attachment based on a parallelepiped-shaped optical prism. Parameters of the proposed attachment are calculated so that it could be arranged inside standard spectrophotometers.
About the authors
V. B. Nguyen
St. Petersburg State University of Information Technologies, Mechanics and Optics (ITMO University)
Author for correspondence.
Email: thulavang@gmail.com
Russian Federation, St. Petersburg, 197101
L. A. Gubanova
St. Petersburg State University of Information Technologies, Mechanics and Optics (ITMO University)
Email: thulavang@gmail.com
Russian Federation, St. Petersburg, 197101
