Measuring the Extinction Index of Dielectric Films Using Frustrated Total Internal Reflectance Spectroscopy
- Авторлар: Nguyen V.1, Gubanova L.1
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Мекемелер:
- St. Petersburg State University of Information Technologies, Mechanics and Optics (ITMO University)
- Шығарылым: Том 44, № 8 (2018)
- Беттер: 746-748
- Бөлім: Article
- URL: https://journals.rcsi.science/1063-7850/article/view/207854
- DOI: https://doi.org/10.1134/S1063785018080278
- ID: 207854
Дәйексөз келтіру
Аннотация
Various methods of measuring the coefficient of light attenuation in optical coatings are considered. It is shown that the dimensionless extinction index of a coating made of a weakly absorbing film-forming material can be measured using a special attachment based on a parallelepiped-shaped optical prism. Parameters of the proposed attachment are calculated so that it could be arranged inside standard spectrophotometers.
Авторлар туралы
V. Nguyen
St. Petersburg State University of Information Technologies, Mechanics and Optics (ITMO University)
Хат алмасуға жауапты Автор.
Email: thulavang@gmail.com
Ресей, St. Petersburg, 197101
L. Gubanova
St. Petersburg State University of Information Technologies, Mechanics and Optics (ITMO University)
Email: thulavang@gmail.com
Ресей, St. Petersburg, 197101