Influence of the Rotation Frequency of a Disk Substrate Holder on the Crystal Structure Characteristics of MOCVD-Grown GaAs Layers
- Авторы: Boldyrevskii P.1, Filatov D.1, Kazantseva I.1, Revin M.1, Smotrin D.1, Yunin P.2
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Учреждения:
- Lobachevsky State University
- Institute for Physics of Microstructures
- Выпуск: Том 63, № 2 (2018)
- Страницы: 211-215
- Раздел: Physical Science of Materials
- URL: https://journals.rcsi.science/1063-7842/article/view/200703
- DOI: https://doi.org/10.1134/S1063784218020068
- ID: 200703
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Аннотация
The influence of the rotation frequency of a disk substrate holder on the growth mechanism and crystal structure characteristics of MOCVD-grown GaAs layers has been studied. In the frequency range of 0–400 rpm, variations have been observed in the growth mechanism and rate, as well as of crystal perfection.
Об авторах
P. Boldyrevskii
Lobachevsky State University
Автор, ответственный за переписку.
Email: bpavel2@rambler.ru
Россия, pr. Gagarina 23, Nizhny Novgorod, 603950
D. Filatov
Lobachevsky State University
Email: bpavel2@rambler.ru
Россия, pr. Gagarina 23, Nizhny Novgorod, 603950
I. Kazantseva
Lobachevsky State University
Email: bpavel2@rambler.ru
Россия, pr. Gagarina 23, Nizhny Novgorod, 603950
M. Revin
Lobachevsky State University
Email: bpavel2@rambler.ru
Россия, pr. Gagarina 23, Nizhny Novgorod, 603950
D. Smotrin
Lobachevsky State University
Email: bpavel2@rambler.ru
Россия, pr. Gagarina 23, Nizhny Novgorod, 603950
P. Yunin
Institute for Physics of Microstructures
Email: bpavel2@rambler.ru
Россия, ul. Ul’yanova 46, Nizhny Novgorod, 603950