Автор туралы ақпарат

Chkhalo, N.

Шығарылым Бөлім Атауы Файл
Том 63, № 10 (2018) Optics Absolutely Calibrated Spectrally Resolved Measurements of Xe Laser Plasma Radiation Intensity in the EUV Range
Том 64, № 11 (2019) Article Simulation of Local Error Correction of the Surface Shape by a Low-Dimensional Ion Beam
Том 64, № 11 (2019) Article Emission Properties of Laser Plasma Excited on Molecular-Cluster Carbon Dioxide Jets
Том 64, № 11 (2019) Article Optical, Mechanical, and Thermal Properties of Free-Standing MoSi2Nx and ZrSi2Ny Nanocomposite Films
Том 64, № 11 (2019) Article Beryllium as a Material for Thermally Stable X-Ray Mirrors
Том 64, № 11 (2019) Article Optimization of Composition, Synthesis, and Study of Broadband Multilayer Mirrors for the EUV Spectral Range
Том 64, № 11 (2019) Article Fabrication and Study of a Concave Crystal Mirror for the KORTES Project
Том 64, № 11 (2019) Article Multilayer Ag/Y Mirrors for the Spectral Range of 9–11 nm
Том 64, № 11 (2019) Article Influence of Beryllium Barrier Layers on the Properties of Mo/Si Multilayer Mirrors
Том 64, № 11 (2019) Article Influence of Thermal Annealing on the Properties of Multilayer Mo/Be Mirrors
Том 64, № 11 (2019) Article Measurement Error of Interferometers with Diffraction Reference Wave
Том 64, № 12 (2019) 23rd INTERNATIONAL SYMPOSIUM “NANOPHYSICS AND NANOELECTRONICS,” Nizhny Novgorod, March 11–14, 2019 Development of Technological Principles for Creating a System of Microfocus X-Ray Tubes Based on Silicon Field Emission Nanocathodes

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