作者的详细信息
Astaf’ev, S. B.
期 | 栏目 | 标题 | 文件 |
卷 62, 编号 2 (2017) | Surface and Thin Films | Application of time–frequency wavelet analysis in the reflectometry of thin films | |
卷 63, 编号 5 (2018) | Surface and Thin Films | Features of Wavelet Analysis in X-Ray Reflectometry of Thin Films | |
卷 64, 编号 1 (2019) | Surface and Thin Films | Synthesis of the Autocorrelation Function for Solving the Thin Film Reflectometry Inverse Problem |