Author Details
Yanusova, L. G.
| Issue | Section | Title | File |
| Vol 62, No 2 (2017) | Surface and Thin Films | Application of time–frequency wavelet analysis in the reflectometry of thin films | |
| Vol 63, No 5 (2018) | Surface and Thin Films | Features of Wavelet Analysis in X-Ray Reflectometry of Thin Films | |
| Vol 64, No 1 (2019) | Surface and Thin Films | Synthesis of the Autocorrelation Function for Solving the Thin Film Reflectometry Inverse Problem |