Apparatus

Выпуск	Название	Файл
Том 64, № 2 (2019)	Cluster Control System in Crystallization Setups for Crystal Growth from Low-Temperature Solutions	(Eng)
Voloshin A., Egorov V., Kalinin A., Manomenova V., Rodionov A., Rodionov I., Rudneva E.
Том 63, № 6 (2018)	Laboratory Microtomographs: Design and Data Processing Algorithms	(Eng)
Buzmakov A., Asadchikov V., Zolotov D., Roshchin B., Dymshits Y., Shishkov V., Chukalina M., Ingacheva A., Ichalova D., Krivonosov Y., Dyachkova I., Balzer M., Castele M., Chilingaryan S., Kopmann A.
Том 62, № 6 (2017)	Neutron time-of-flight reflectometer GRAINS with horizontal sample plane at the IBR-2 reactor: Possibilities and prospects	(Eng)
Avdeev M., Bodnarchuk V., Petrenko V., Gapon I., Tomchuk O., Nagorny A., Ulyanov V., Bulavin L., Aksenov V.
Том 62, № 5 (2017)	New hardware and software platform for experiments on a HUBER-5042 X-ray diffractometer with a DISPLEX DE-202 helium cryostat in the temperature range of 20–300 K	(Eng)
Dudka A., Antipin A., Verin I.
Том 61, № 4 (2016)	Calibration of CryojetHT and Cobra Plus Cryosystems used in X-ray diffraction studies	(Eng)
Dudka A., Verin I., Smirnova E.
Том 61, № 3 (2016)	Study of the influence of the parameters of an experiment on the simulation of pole figures of polycrystalline materials using electron microscopy	(Eng)
Antonova A., Savyolova T.
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