New hardware and software platform for experiments on a HUBER-5042 X-ray diffractometer with a DISPLEX DE-202 helium cryostat in the temperature range of 20–300 K
- Authors: Dudka A.P.1, Antipin A.M.1,2, Verin I.A.1
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Affiliations:
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
- National Research Center “Kurchatov Institute”
- Issue: Vol 62, No 5 (2017)
- Pages: 797-801
- Section: Apparatus
- URL: https://journals.rcsi.science/1063-7745/article/view/191374
- DOI: https://doi.org/10.1134/S1063774517050054
- ID: 191374
Cite item
Abstract
Huber-5042 diffractometer with a closed-cycle Displex DE-202 helium cryostat is a unique scientific instrument for carrying out X-ray diffraction experiments when studying the single crystal structure in the temperature range of 20–300 K. To make the service life longer and develop new experimental techniques, the diffractometer control is transferred to a new hardware and software platform. To this end, a modern computer; a new detector reader unit; and new control interfaces for stepper motors, temperature controller, and cryostat vacuum pumping system are used. The system for cooling the X-ray tube, the high-voltage generator, and the helium compressor and pump for maintaining the desired vacuum in the cryostat are replaced. The system for controlling the primary beam shutter is upgraded. A biological shielding is installed. The new program tools, which use the Linux Ubuntu operating system and SPEC constructor, include a set of drivers for control units through the aforementioned interfaces. A program for searching reflections from a sample using fast continuous scanning and a priori information about crystal is written. Thus, the software package for carrying out the complete cycle of precise diffraction experiment (from determining the crystal unit cell to calculating the integral reflection intensities) is upgraded. High quality of the experimental data obtained on this equipment is confirmed in a number of studies in the temperature range from 20 to 300 K.
About the authors
A. P. Dudka
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
Author for correspondence.
Email: dudka@ns.crys.ras.ru
Russian Federation, Moscow, 119333
A. M. Antipin
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Center “Kurchatov Institute”
Email: dudka@ns.crys.ras.ru
Russian Federation, Moscow, 119333; Moscow, 112182
I. A. Verin
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
Email: dudka@ns.crys.ras.ru
Russian Federation, Moscow, 119333