Application of Empirical Si–O–C Potential to Simulate Amorphous Atomic Structures and Transition Layers by the Bond Switching Method


如何引用文章

全文:

开放存取 开放存取
受限制的访问 ##reader.subscriptionAccessGranted##
受限制的访问 订阅存取

详细

The parameters of REBO2 empirical potential for the Si–O–C system are presented. The results of the calculations using this potential agree well with the experimental values of the lengths and angles of unit cells, bond energy, and surface energy for Si, SiO2, and SiC. The algorithm of bond switching in a multicomponent system has been developed and tested. A method is proposed to simulate the structure of the transition layer between crystalline Si and amorphous SiO2, as well as between crystalline SiC and amorphous SiO2.

作者简介

I. Belov

National Research Centre “Kurchatov Institute”

编辑信件的主要联系方式.
Email: ivanbelov1977@gmail.com
俄罗斯联邦, pl. Akademika Kurchatova 1, Moscow, 123182

补充文件

附件文件
动作
1. JATS XML

版权所有 © Pleiades Publishing, Inc., 2019