Application of Empirical Si–O–C Potential to Simulate Amorphous Atomic Structures and Transition Layers by the Bond Switching Method
- 作者: Belov I.V.1
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隶属关系:
- National Research Centre “Kurchatov Institute”
- 期: 卷 64, 编号 4 (2019)
- 页面: 662-668
- 栏目: Nanomaterials and Ceramics
- URL: https://journals.rcsi.science/1063-7745/article/view/194151
- DOI: https://doi.org/10.1134/S1063774519040059
- ID: 194151
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详细
The parameters of REBO2 empirical potential for the Si–O–C system are presented. The results of the calculations using this potential agree well with the experimental values of the lengths and angles of unit cells, bond energy, and surface energy for Si, SiO2, and SiC. The algorithm of bond switching in a multicomponent system has been developed and tested. A method is proposed to simulate the structure of the transition layer between crystalline Si and amorphous SiO2, as well as between crystalline SiC and amorphous SiO2.
作者简介
I. Belov
National Research Centre “Kurchatov Institute”
编辑信件的主要联系方式.
Email: ivanbelov1977@gmail.com
俄罗斯联邦, pl. Akademika Kurchatova 1, Moscow, 123182
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