Inelastic X-ray scattering with very high resolution at the ESRF
- 作者: Krisch M.1, Sette F.1
-
隶属关系:
- European Synchrotron Radiation Facility
- 期: 卷 62, 编号 1 (2017)
- 页面: 1-12
- 栏目: Reviews
- URL: https://journals.rcsi.science/1063-7745/article/view/190559
- DOI: https://doi.org/10.1134/S1063774517010096
- ID: 190559
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详细
The investigation of phonon dispersion in crystalline materials and collective atom motions in disordered matter such as liquids and glasses by inelastic X-ray scattering has attracted a diversified user community with the advent of 3rd generation synchrotron sources. The present article provides a short historical account of the research field and discusses selected highlights of research performed on the ESRF inelastic scattering beamlines ID16 and ID28 in the past ten years.
作者简介
M. Krisch
European Synchrotron Radiation Facility
编辑信件的主要联系方式.
Email: krisch@esrf.fr
法国, 71 Avenue des Martyrs, Grenoble, 38000
F. Sette
European Synchrotron Radiation Facility
Email: krisch@esrf.fr
法国, 71 Avenue des Martyrs, Grenoble, 38000
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