Inelastic X-ray scattering with very high resolution at the ESRF
- Авторлар: Krisch M.1, Sette F.1
-
Мекемелер:
- European Synchrotron Radiation Facility
- Шығарылым: Том 62, № 1 (2017)
- Беттер: 1-12
- Бөлім: Reviews
- URL: https://journals.rcsi.science/1063-7745/article/view/190559
- DOI: https://doi.org/10.1134/S1063774517010096
- ID: 190559
Дәйексөз келтіру
Аннотация
The investigation of phonon dispersion in crystalline materials and collective atom motions in disordered matter such as liquids and glasses by inelastic X-ray scattering has attracted a diversified user community with the advent of 3rd generation synchrotron sources. The present article provides a short historical account of the research field and discusses selected highlights of research performed on the ESRF inelastic scattering beamlines ID16 and ID28 in the past ten years.
Авторлар туралы
M. Krisch
European Synchrotron Radiation Facility
Хат алмасуға жауапты Автор.
Email: krisch@esrf.fr
Франция, 71 Avenue des Martyrs, Grenoble, 38000
F. Sette
European Synchrotron Radiation Facility
Email: krisch@esrf.fr
Франция, 71 Avenue des Martyrs, Grenoble, 38000
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