Defect structure of TiS3 single crystals of the A-ZrSe3 type


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The defect structure of TiS3 single crystals of the A-ZrSe3 type has been determined based on X-ray diffraction data. Shear defects manifest themselves as displacements of ab layers (which can imitate a twin) by ∼0.5a. Regular shears facilitate the formation of a superstructure along the c axis. A model of defect in the layer structure is proposed to explain the atomic displacements at an angle to the layer plane.

Авторлар туралы

N. Bolotina

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”

Хат алмасуға жауапты Автор.
Email: nb_bolotina@mail.ru
Ресей, Moscow, 119333

I. Gorlova

Kotel’nikov Institute of Radioengineering and Electronics

Email: nb_bolotina@mail.ru
Ресей, Moscow, 125009

I. Verin

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”

Email: nb_bolotina@mail.ru
Ресей, Moscow, 119333

A. Titov

Mikheev Institute of Metal Physics, Ural Branch

Email: nb_bolotina@mail.ru
Ресей, Yekaterinburg, 620041

A. Arakcheeva

Phase Solutions, Co Ltd.

Email: nb_bolotina@mail.ru
Швейцария, Lausanne, 1012

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