Defect structure of TiS3 single crystals of the A-ZrSe3 type


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Abstract

The defect structure of TiS3 single crystals of the A-ZrSe3 type has been determined based on X-ray diffraction data. Shear defects manifest themselves as displacements of ab layers (which can imitate a twin) by ∼0.5a. Regular shears facilitate the formation of a superstructure along the c axis. A model of defect in the layer structure is proposed to explain the atomic displacements at an angle to the layer plane.

About the authors

N. B. Bolotina

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”

Author for correspondence.
Email: nb_bolotina@mail.ru
Russian Federation, Moscow, 119333

I. G. Gorlova

Kotel’nikov Institute of Radioengineering and Electronics

Email: nb_bolotina@mail.ru
Russian Federation, Moscow, 125009

I. A. Verin

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”

Email: nb_bolotina@mail.ru
Russian Federation, Moscow, 119333

A. N. Titov

Mikheev Institute of Metal Physics, Ural Branch

Email: nb_bolotina@mail.ru
Russian Federation, Yekaterinburg, 620041

A. V. Arakcheeva

Phase Solutions, Co Ltd.

Email: nb_bolotina@mail.ru
Switzerland, Lausanne, 1012


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