Analyzing the Influence of Temperature on the Electrophysical Characteristics of a Complementary Pair of Vertical Bipolar Transistors
- 作者: Hrapov M.O.1, Gluhov A.V.2, Gridchin V.A.1, Kalinin S.V.1
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隶属关系:
- Novosibirsk State Technical University
- Siberian State University of Informatics and Telecommunications
- 期: 卷 47, 编号 7 (2018)
- 页面: 472-478
- 栏目: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186962
- DOI: https://doi.org/10.1134/S1063739718070053
- ID: 186962
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详细
The influence of temperature on the most important electrical parameters of a complementary bipolar pair of vertical transistors is numerically investigated in the thermodynamic and drift-diffusion models. The advantage of the thermodynamic model in analyzing high-power transistors due to the fact that this model takes into account the self-heating effect is demonstrated;. The simulation results are compared with the experimental characteristics of the test structures. The comparison shows that, for the current amplification factor β and the Early voltage VA, the computational error is less than 15%; for the critical parameter, the collector–emitter breakdown voltage VCE0, it is less than 2%, which is sufficient to use the thermodynamic model for practical purposes.
作者简介
M. Hrapov
Novosibirsk State Technical University
编辑信件的主要联系方式.
Email: hrapov.mihail@gmail.com
俄罗斯联邦, Novosibirsk
A. Gluhov
Siberian State University of Informatics and Telecommunications
Email: hrapov.mihail@gmail.com
俄罗斯联邦, Novosibirsk
V. Gridchin
Novosibirsk State Technical University
Email: hrapov.mihail@gmail.com
俄罗斯联邦, Novosibirsk
S. Kalinin
Novosibirsk State Technical University
Email: hrapov.mihail@gmail.com
俄罗斯联邦, Novosibirsk
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