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Russian Microelectronics
ISSN 1063-7397 (Print) ISSN 1608-3415 (Online)
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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V

Vagin, M. S.
Vakulov, Z. E.
Varzarev, Yu. N.
Vasil’ev, S. V.
Vasilev, S. V.
Vasiliev, S. V.
Vasilyev, N. O.
Vasilyev, V. Yu.
Vassiliev, V. P.
Vavilin, K. V.
Verezub, N. A.
Vergazov, R. M.
Verizhnikov, A. I.
Vertyanov, D. V.
Vigdorovich, E. N.
Vlasov, A. I.
Volkov, P. V.
Volkov, S. I.
Volkova, T. V.
Vorob’eva, A. I.
Vorobjova, A. I.
Voronets, Ya. S.
Voronov, D. D.
Vyurkov, V. V.

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