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Russian Microelectronics
ISSN 1063-7397 (Print) ISSN 1608-3415 (Online)
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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L

Lachinov, A. N.
Lagun, A. M.
Lakalin, A. V.
Lankevich, Yu. Yu.
Lapin, A. V.
Larina, N. A.
Latukhina, N. V.
Latyshev, A. V.
Lavrentyev, K. K.
Lavrukhin, D. V.
Lebedev, M. E.
Lebedev, V. I.
Ledentsova, N. E.
Levchenko, N. N.
Li, I. P.
Lisina, I. G.
Lisitsyn, S. A.
Litsoev, S. V.
Loboda, V. V.
Loginova, I. P.
Lomonova, E. E.
Lomov, A. A.
Lopatkin, A. V.
Losev, V. V.
Luckichev, V. F.

1 - 25 of 30 Items    1 2 > >> 
 

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