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Russian Microelectronics
ISSN 1063-7397 (Print) ISSN 1608-3415 (Online)
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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D

Dabagov, A. R.
Dallaev, R. S.
Davydov, G. G.
Davydov, N. V.
Dem’yanenko, A. V.
Demeneva, A. I.
Demidova, A. V.
Denisenko, D. Yu.
Denisenko, M. A.
Derevyashkin, S. V.
Devlikanova, S. S.
Didenko, S. I.
Djuzhev, N. A.
Doludenko, I. M.
Dorofeev, A. A.
Dragunov, V. P.
Dshkhunyan, V. L.
Dubkov, S. V.
Dudin, A. A.
Dunaev, A. V.
Dvornikov, O. V.
Dvurechenskii, A. V.
Dyatlov, N. S.
Dziatlau, V. L.
Dzyubanenko, S. V.

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