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Russian Microelectronics
ISSN 1063-7397 (Print) ISSN 1608-3415 (Online)
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
Home > Search > Browse Author Index

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C

Chaplygin, Y. A.
Chaplygin, Yu. A.
Chebykin, A. G.
Chekmachev, V. G.
Chepurnov, V. I.
Cheremisinov, A. A.
Cheremisinov, D. I.
Cheremisinova, L. D.
Cherkesov, I. V.
Chernikova, A. G.
Chernyak, M. E.
Chernyavskii, A. Yu.
Chernykh, A. V.
Chernykh, S. V.
Chesnitskiy, A. V.
Chesnokov, Yu. M.
Chichkov, M. V.
Chitanov, D. N.
Chochaev, R. Zh.
Chopra, Pradeep
Chugunov, E. Yu.
Chukov, G. V.
Chumakov, A. I.
Churilov, A. B.

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