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Russian Microelectronics
ISSN 1063-7397 (Print) ISSN 1608-3415 (Online)
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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R

Roshchin, V. M.
Roshchina, A. V.
Roshchupkin, D. V.
Roslyakov, I. V.
Rossolenko, A. N.
Rozanov, R. Yu.
Rozhkov, A. S.
Ruban, O. A.
Rudakov, G. A.
Rudenko, K. V.
Rudenko, M. K.
Rudyi, A. S.
Rusak, T. F.
Rusakov, S. G.
Ryabochkina, P. A.
Ryabov, V. T.
Ryabtsev, I. I.
Rybakov, A. A.
Rygalin, B. N.
Rygalin, D. B.
Ryndin, E. A.
Ryzhova, D. I.
Ryzhova, M. V.
Ryzhuk, R. V.

S

Sadkov, V. D.

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