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Russian Microelectronics
ISSN 1063-7397 (Print) ISSN 1608-3415 (Online)
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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Keywords ADC DAC GaAs MIS varicap RUSSIAN Microelectronics atomic force microscopy compaction in a magnetic field ferroelectrics gallium arsenide gallium nitride heterostructure heterostructures interface leakage current magnetic texture phase shifter porous silicon recrystallization silicon carbide varicap zirconia
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P

Petrunina, S. S.
Petukhov, I. N.
Pevtsov, E. Ph.
Pil’kevich, A. V.
Pilipko, M. M.
Pisarenko, I. V.
Pivovarenok, S. A.
Plavich, M. L.
Pleshkov, A. S.
Pogalov, A. I.
Polisan, A. A.
Polokhin, A. A.
Polomoshnov, S. A.
Polunin, V. A.
Polushin, N. I.
Polyakova, V. V.
Ponomarev, D. S.
Popkova, A. V.
Popov, A. D.
Popov, D. A.
Potupchik, A. G.
Prokaznikov, A. V.
Prokof’ev, I. V.
Prokof’ev, M. V.
Prokopenko, N. N.

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