Russian Microelectronics
ISSN 1063-7397 (Print)
ISSN 1608-3415 (Online)
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Keywords
ADC
DAC
GaAs
MIS varicap
RUSSIAN Microelectronics
atomic force microscopy
compaction in a magnetic field
ferroelectrics
gallium arsenide
gallium nitride
heterostructure
heterostructures
interface
leakage current
magnetic texture
phase shifter
porous silicon
recrystallization
silicon carbide
varicap
zirconia
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Keywords
ADC
DAC
GaAs
MIS varicap
RUSSIAN Microelectronics
atomic force microscopy
compaction in a magnetic field
ferroelectrics
gallium arsenide
gallium nitride
heterostructure
heterostructures
interface
leakage current
magnetic texture
phase shifter
porous silicon
recrystallization
silicon carbide
varicap
zirconia
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Author Details
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Schemerov, I. V.
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Vol 46, No 8 (2017)
Article
On the Problem of Determining the Bulk Lifetime by Photoconductivity Decay on the Unpassivated Samples of Monocrystalline Silicon
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