Resistive switchings and diode properties of heterostructures based on epitaxial superconducting Nd2–xCexCuO4–y films

Abstract

Reversible and reliable bistable resistive switchings are observed in planar-type Nd_2–xCe_xCuO_4–y/Nd_2–xCe_xO_1.75/Ag junctions based on the Nd_2–xCe_xCuO_4–y superconducting films. Investigation of electronic structure of surface of the Nd_0.5Ce_0.5O_1.75/Nd_2–xCe_xCuO_4–y via high-resolution X-ray photoelectron spectroscopy and atomic force microscopy (AFM) show that the key factor for the switchings is the presence of an oxygen-deficient Nd_2-xCe_xO_1.75 phase, epitaxially intergrown on surfaces of Nd_2–xCe_xCuO_4–y.