Resistive switchings and diode properties of heterostructures based on epitaxial superconducting Nd2–xCexCuO4–y films


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Reversible and reliable bistable resistive switchings are observed in planar-type Nd2–xCexCuO4–y/Nd2–xCexO1.75/Ag junctions based on the Nd2–xCexCuO4–y superconducting films. Investigation of electronic structure of surface of the Nd0.5Ce0.5O1.75/Nd2–xCexCuO4–y via high-resolution X-ray photoelectron spectroscopy and atomic force microscopy (AFM) show that the key factor for the switchings is the presence of an oxygen-deficient Nd2-xCexO1.75 phase, epitaxially intergrown on surfaces of Nd2–xCexCuO4–y.

Sobre autores

N. Tulina

Institute of Solid State Physics

Autor responsável pela correspondência
Email: tulina@issp.ac.ru
Rússia, Chernogolovka, Moscow oblast, 142432

A. Ivanov

Moscow Engineering Physics Institute (MEPhI)

Email: tulina@issp.ac.ru
Rússia, Moscow, 115409

A. Rossolenko

Institute of Solid State Physics

Email: tulina@issp.ac.ru
Rússia, Chernogolovka, Moscow oblast, 142432

I. Shmytko

Institute of Solid State Physics

Email: tulina@issp.ac.ru
Rússia, Chernogolovka, Moscow oblast, 142432

A. Ionov

Institute of Solid State Physics

Email: tulina@issp.ac.ru
Rússia, Chernogolovka, Moscow oblast, 142432

R. Mozhchil

Institute of Solid State Physics; Moscow Engineering Physics Institute (MEPhI)

Email: tulina@issp.ac.ru
Rússia, Chernogolovka, Moscow oblast, 142432; Moscow, 115409

S. Bozhko

Institute of Solid State Physics

Email: tulina@issp.ac.ru
Rússia, Chernogolovka, Moscow oblast, 142432

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