Electronic structure of SiO2: An X-ray emission spectroscopic and density functional theoretical study

Abstract

The electronic structure of SiO2 is investigated by means of valence to core X-ray emission spectroscopy and quantum-mechanical calculations in the density functional theory approximation. Analysis of a complete set of SiKα1, SiL2, 3, and OKα X-ray emission and XPS spectra along with the calculated data provides comprehensive information on chemical interactions that occur in SiO2.

About the authors

T. N. Danilenko

Research Institute of Physics

Author for correspondence.
Email: tdanil1982@yandex.ru
Russian Federation, Rostov-on-Don, 344090

M. M. Tatevosyan

Research Institute of Physics

Email: tdanil1982@yandex.ru
Russian Federation, Rostov-on-Don, 344090

V. G. Vlasenko

Research Institute of Physics

Email: tdanil1982@yandex.ru
Russian Federation, Rostov-on-Don, 344090

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