Enviar artigo por via de e-mail Electronic structure of SiO2: An X-ray emission spectroscopic and density functional theoretical study
- Autores: Danilenko T.N.1, Tatevosyan M.M.1, Vlasenko V.G.1
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Afiliações:
- Research Institute of Physics
- Edição: Volume 80, Nº 6 (2016)
- Páginas: 738-741
- Seção: Proceedings of the Interdisciplinary Symposium “Ordering in Minerals and Alloys” OMA-18 and Proceedings of the International Interdisciplinary Symposium “Order, Disorder, and Properties of Oxides” ODPO-18
- URL: https://journals.rcsi.science/1062-8738/article/view/184612
- DOI: https://doi.org/10.3103/S1062873816060113
- ID: 184612
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Resumo
The electronic structure of SiO2 is investigated by means of valence to core X-ray emission spectroscopy and quantum-mechanical calculations in the density functional theory approximation. Analysis of a complete set of SiKα1, SiL2, 3, and OKα X-ray emission and XPS spectra along with the calculated data provides comprehensive information on chemical interactions that occur in SiO2.
Sobre autores
T. Danilenko
Research Institute of Physics
Autor responsável pela correspondência
Email: tdanil1982@yandex.ru
Rússia, Rostov-on-Don, 344090
M. Tatevosyan
Research Institute of Physics
Email: tdanil1982@yandex.ru
Rússia, Rostov-on-Don, 344090
V. Vlasenko
Research Institute of Physics
Email: tdanil1982@yandex.ru
Rússia, Rostov-on-Don, 344090
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