Solved and Unsolved Problems of the Metrology of Chemical Analysis

Abstract

The state-of-the-art of metrological support of chemical analysis is considered. The specificity of this field of metrology is discussed, that is, the absence of a primary material standard of the fundamental physical quantity, mole, and the dependence of the results of measurements on the chemical composition of a sample. Advances in the development of the metrology of chemical analysis are noted. The focus of the review is on the problems that remain unresolved or incompletely resolved. These are the metrology of sampling, the control of the accuracy of analysis, the assurance of metrological traceability, the nomenclature of the existing standard samples of composition, and the estimation of the budget of uncertainty. Particular emphasis is placed on metrology regarding new types of chemical analysis, for example, surface analysis, local analysis, and analysis of nanodimensional samples. The priority of improving the metrology of electron-probe analysis, Auger electron spectroscopy, electron spectroscopy for chemical analysis, and secondary-ion mass spectrometry is noted. A conclusion is made about the need in intensifying research for decreasing the number of unsolved problems cardinally.