Email this article Digital X-ray 3D-microtomograph for testing materials and components used in electronics
- Authors: Syryamkin V.I.1
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Affiliations:
- Tomsk State University
- Issue: Vol 52, No 9 (2016)
- Pages: 504-511
- Section: X-Ray Methods
- URL: https://journals.rcsi.science/1061-8309/article/view/181178
- DOI: https://doi.org/10.1134/S1061830916090060
- ID: 181178
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Abstract
An intelligent X-ray microtomograph is described. The flow chart, software, and experimental results are presented.
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About the authors
V. I. Syryamkin
Tomsk State University
Author for correspondence.
Email: egs@sibmail.com
Russian Federation, Tomsk, 634050
