Digital X-ray 3D-microtomograph for testing materials and components used in electronics


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详细

An intelligent X-ray microtomograph is described. The flow chart, software, and experimental results are presented.

作者简介

V. Syryamkin

Tomsk State University

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Email: egs@sibmail.com
俄罗斯联邦, Tomsk, 634050


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