Digital X-ray 3D-microtomograph for testing materials and components used in electronics
- 作者: Syryamkin V.1
-
隶属关系:
- Tomsk State University
- 期: 卷 52, 编号 9 (2016)
- 页面: 504-511
- 栏目: X-Ray Methods
- URL: https://journals.rcsi.science/1061-8309/article/view/181178
- DOI: https://doi.org/10.1134/S1061830916090060
- ID: 181178
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详细
An intelligent X-ray microtomograph is described. The flow chart, software, and experimental results are presented.