The Method for Determining the Exact Single Crystal Orientation with Simultaneous X-Ray Energy Correction Using the Spectrum of Diffraction Losses

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Дәйексөз келтіру

Толық мәтін

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Аннотация

The intensity loss of transmitted beam due to parasitic diffraction (glitches) is an inherent property of single-crystal X-ray optics. This effect can lead to a weakening of the radiation, up to its complete disappearance. Therefore, understanding the effect of diffraction loss is essential for any experiments that use single-crystal optics. We present theory of glitch formation and demonstrate its application to experimental data to determine the orientation and cell parameters of optical elements made of the single-crystal diamond. A systematic error was found in determining the absolute energy of X-ray, which occurs due to the wrong monochromator tuning (an error in determining the absolute 2θ angle). The described error very often occurs during the experiment as a result of the fact that determining the absolute 2θ angle of the monochromator crystal is a technically difficult task. Simultaneous determination of the orientation and lattice parameters of the studied sample, together with the compensation of the systematic error in the monochromator tuning, made it possible to significantly improve the accuracy of processing the obtained data.

Авторлар туралы

N. Klimova

Immanuel Kant Baltic Federal University

Хат алмасуға жауапты Автор.
Email: klimovanb@gmail.com
Russia, 236014, Kaliningrad

A. Snigirev

Immanuel Kant Baltic Federal University

Хат алмасуға жауапты Автор.
Email: anatoly.snigirev@gmail.com
Russia, 236014, Kaliningrad

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© Н.Б. Климова, А.А. Снигирев, 2023

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