3D Simulation of Electronic Exchange between an Atomic Particle and a Defect-Containing Surface - PDF (Russian)
Copyright (c) 2023 Н.Е. Климов, И.К. Гайнуллин
Copyright (c) 2023 Н.Е. Климов, И.К. Гайнуллин
ISSN 1028-0960 (Print)
ISSN 3034-5731 (Online)
User
Article Tools
Email this article (Login required)
Email the author (Login required)
Email this article (Login required)
Email the author (Login required)
Keywords
X-ray diffraction
X-ray phase analysis
X-ray photoelectron spectroscopy
atomic force microscopy
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
transmission electron microscopy
zinc oxide
Subscription
Login to verify subscription
×
User
Article Tools
Email this article (Login required)
Email the author (Login required)
Email this article (Login required)
Email the author (Login required)
Keywords
X-ray diffraction
X-ray phase analysis
X-ray photoelectron spectroscopy
atomic force microscopy
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
transmission electron microscopy
zinc oxide
Subscription
Login to verify subscription
Copyright (c) 2023 Н.Е. Климов, И.К. Гайнуллин