Electron Diffraction Analysis of the Structure of Carbon Nanopillars along the Growth Direction
- 作者: Volkov R.L.1, Borgardt N.I.1, Gromov D.G.1, Dubkov S.V.1
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隶属关系:
- National Research University Moscow Institute of Electronic Technology
- 期: 卷 12, 编号 3 (2018)
- 页面: 473-479
- 栏目: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/195356
- DOI: https://doi.org/10.1134/S1027451018030199
- ID: 195356
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详细
The structure of carbon nanopillars grown without catalysis by low-temperature plasmaenhanced-chemical-vapor deposition on a silicon substrate is investigated using the suggested focused ion beam technique for preparing a sample composed of several thin plan-view foils. Studying the prepared sample by electron diffraction and bright-field transmission electron microscopy allows determination of the variation of the two-dimensionally ordered crystallite fraction along the growth direction. It us established that the crystalline phase fraction inside the nanopillars gradually decreases during the growth process. Nearly 90% of the crystalline material is located between the base and the middle of the nanopillars while their upper parts almost entirely consist of amorphous carbon.
作者简介
R. Volkov
National Research University Moscow Institute of Electronic Technology
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俄罗斯联邦, Moscow, 124498
N. Borgardt
National Research University Moscow Institute of Electronic Technology
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俄罗斯联邦, Moscow, 124498
D. Gromov
National Research University Moscow Institute of Electronic Technology
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俄罗斯联邦, Moscow, 124498
S. Dubkov
National Research University Moscow Institute of Electronic Technology
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俄罗斯联邦, Moscow, 124498
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